Saturday, September 14

8:00 AM

ESD Compliance Verification Technician to TR53 - Day 1

8:30 AM

FC100: ESD Basics for the Program Manager

FC340: ESD Program Development and Assessment (ANSI/ESD S20.20 Seminar) - Day 1

Introduction to On-Chip ESD Protection

Sunday, September 15

8:00 AM

ESD Compliance Verification Technician to TR53 - Day 2

8:30 AM

FC340: ESD Program Development and Assessment (ANSI/ESD S20.20 Seminar) - Day 2

FC101: How To’s of In-Plant ESD Auditing and Evaluation Measurements

Introduction to Characterization of On-Chip ESD Protection

1:00 PM

Overview on ESD and Latch-up Challenges in 2.5D and 3D-Stacked ICs & ESD Design Challenges of RF and High Speed I/Os

Monday, September 16

7:00 AM
8:00 AM

ESD Compliance Verification Technician to TR53 - Exam

8:30 AM

KEYNOTE: Memory Technology Advancements Driving High Performance, Reliable Systems

9:20 AM
9:30 AM

Invited Talk TBA

Device Testing Invited Talk TBA

10:20 AM

Networking Coffee Break

10:50 AM

1B.1 TLP/VFTLP Investigation on eNVM 1T1R PCM in FD-SOI UTBB CMOS Technology at Room Temperature (ESREF Invited Paper)

Invited Talk TBA

11:15 AM

1B.2 Can CC-TLP be used as an Early Failure Analysis Tool?

11:40 AM

Authors Corner for 1B.1 and 1B.2

12:00 PM

Symposium Paper Awards Presentation Lunch

1:00 PM

Manufacturing Invited Talk: Air Ionization and it’s Use in Controlling Static Charge

1:50 PM

Manufacturing Invited Talk - Healthcare TBA

2:15 PM

Manufacturing Invited Talk - Electrostatic Discharge (ESD) Control in Healthcare

2:40 PM

Afternoon Networking Break

First Time Attendee and Emerging Professionals Reception

3:10 PM

1A.1 Accuracy Preserving Extensions to a PDK MOSFET Model for ESD Simulation

M1.1 In-Situ ESD Current Sensing in a Pick and Place Machine

3:35 PM

1A.2 CDM ESD Risk Assessment for Ground-Crossing Circuit Through PERC P2P/CD Programming

M1.2 Qualification Challenges of Conductive and Dissipative Plastics

4:00 PM

Author's Corner for 1A.1 and 1A.2

Authors Corner for M1.1 and M1.2

4:20 PM

Manufacturing Hands-On Intro Presentation - Ionization

1A.3 A Physics-Based Model for ESD Protection Devices with Open Base BJT Configuration

4:45 PM

Manufacturing Hands-On Session - Ionization

1A.4 Substrate NPN Extraction from Capacitance Field Solver

5:00 PM

Professional and Technical Women's Reception

5:10 PM

1A.5 An Efficient and Cost-effective Method to Detect and Analyze ESD CDM Risks in Designs

5:35 PM

Authors Corner for 1A.3, 1A.4, and 1A.5

6:00 PM

Welcome Reception and Exhibits Open

Tuesday, September 17

7:00 AM
8:00 AM
8:10 AM

KEYNOTE: Charting the Connected Future

8:30 AM

Exhibits Open - Coffee Available

9:00 AM

Activities in the Exhibit Hall - Guided Introduction Tour(s) to Meet the Exhibitors

Networking Coffee Break in the exhibit hall

9:45 AM

2A.1 ESD Behavior of RF Switches and Importance of System Efficient ESD Design (EMC+SIPI Exchange Paper)

Manufacturing Hands-On Intro Presentation - Personnel Grounding

10:10 AM

2A.2 On-Chip ESD Protection for Multi-Gbps Automotive Serial IO in a 16-nm FinFET Process

Manufacturing Hands-on Session - Personnel Grounding

10:35 AM

2A.3 Influence of TVS Properties and Printed Circuit Board Design on System Level ESD Robustness for USB-C High-Speed Data Lines

11:00 AM

Authors Corner for 2A.1, 2A.2, and 2A.3

11:20 AM

Activities in the Exhibit Hall - 20-minute In-Booth Demonstrations (parallel sessions)

12:00 PM

EMC Invited Talk: TBA

Manufacturing Invited Talk - Overview of all ESDA Control Standards

12:50 PM

Light Networking Lunch in the exhibit hall

1:50 PM
3:05 PM

Afternoon Networking Break in the Exhibit Hall

3:35 PM

Photonics Invited Talk: TBA

2B.1 Consideration of Waveform Analysis and Test Method for Charged Board Event (RCJ Exchange Paper)

Manufacturing Showcase Demonstrations - Seating, Bags, Process Assessment

4:00 PM

2B.2 Proposing a Strategy to Prevent Module-level Charged Device Model Failures in Dual In-line Memory Modules

4:25 PM

Standards Corner: Learn more about EOS/ESD Association, Inc. Standards

Authors Corner for 2B.1 and 2B.2

4:55 PM

3A.1 ESD Robustness of Germanium Photodetectors in Advanced Silicon Photonics Technology

2B.3 Intrinsic Inductance and Time-Dependent Resistance of the FI-CDM Spark

Manufacturing Showcase Demonstrations - Seating, Bags, Process Assessment

5:20 PM

3A.2 ESD-EOS-OVP Protection Network for Battery Pins

2B.4 The Demand for a CDM Bare Die Testing Method

5:45 PM

3A.3 Bidirectional DIAC Devices with Two-Stage Triggering

2B.5 FI-CDM and LICCDM Testing on Wafer, Single Die, and Package Levels

6:10 PM

Authors Corner for 3A.1, 3A.2, and 3A.3

Authors Corner for 2B.3, 2B.4, and 2B.5

6:30 PM

Semiconductor Fab ESD/Electrostatic Attraction (ESA) Controls Discussion Group

Volunteer Showcase Reception - Open to All Attendees

Wednesday, September 18

7:00 AM

Registration Open

8:00 AM
8:10 AM

KEYNOTE: Advanced Failure Analysis Techniques and Workflows for 3D Packaged Devices

8:30 AM

Exhibits Open - Coffee Available

9:00 AM

Activities in the Exhibit Hall - 20-minute In-Booth Demonstrations (parallel sessions)

Networking Coffee Break in the exhibit hall

9:40 AM

4A.1 Transistor Layout and Technology Impacts on ESD HBM Performance of GaN-on-SiC RF HEMTs

3B.1 A Statistical Explanation of CDM Qualification Variability

Manufacturing Showcase Demonstrations - Seating, Bags, Process Assessment

10:05 AM

4A.2 ESD Protection Analysis for 3D NAND Internal Source Plate Discharge Circuit

3B.2 Secondary Discharges during FICDM stress - Source and Solution

10:30 AM

4A.3 Efficient Pre-Silicon ESD Verification for Enabling High Performance IO Design

3B.3 System CDM Modeling for High-Speed Interface Devices

10:55 AM

Authors Corner for 4A.1, 4A.2, and 4A.3

Authors Corner for 3B.1, 3B.2, and 3B.3

11:15 AM

Emerging Technologies Invited Talk: Root Cause Categories for Electrical Over-Stress (EOS) and Electrically Induced Physical Damage (EIPD) on Customer Returns and Qualification Failures

Device Testing Invited Talk TBA

12:05 PM

Light Networking Lunch in the exhibit hall

1:10 PM

Factory Controls Ionization Workshop

2:25 PM

Afternoon Networking Break

2:55 PM

Emerging Technologies Talk TBA

Manufacturing Invited Paper - Static Control for Roll to Roll Manufacturing

3:45 PM

Emerging Technologies Talk TBA

M2.1 Static Cracking Due to Electro-Static Discharge During Glass Substrate Transferring System in Vacuum

4:10 PM

M2.2 Using Discharge Current Measurements in Risk Assessments

4:35 PM

Authors Corner for M2.1 and M2.2

4:55 PM

5A.1 TDDB of Sensitive Gate Dielectrics – Revisited for CDM

Manufacturing Hands-On Intro Presentation - Process Assessment

5:20 PM

5A.2 Self-Sufficient ESD Solution for Fail-safe I/O Design in FinFET technology

Manufacturing Hands-On Session - Process Assessment

5:45 PM

5A.3 Single Event Latch-up (SEL) Rate Prediction Methodology in Bulk FinFET Technology

6:10 PM

Authors Corner for 5A.1, 5A.2, and 5A.3

6:30 PM

General Chair's Reception and TEsD Talk "Shockingly Enlightening: A Jolting Recap of the 2024 EOS/ESD Symposium" (Open to All Attendees)

Thursday, September 19

8:00 AM

Professional Program Manager Certification Exam