Tuesday, September 17
System Level Workshop - Automotive System Level ESD Protection Design in the Times of Multi-Gigabit Data Rates
Steffen Holland
Steffen Holland received his diploma and PhD in Physics from the University of Hamburg in 2004. He joined Philips Semiconductors/NXP/Nexperia in the process development group for discrete bipolar devices in Hamburg, Germany in 2005. The main focus of his work quickly became TCAD process and device simulations for discrete ESD protection devices. He works now on discrete ESD protection devices. His current interests are system level ESD simulations. He currently serves in the Board of Directors at the ESD Association and is chair of the ESDA working group 26.
System Level Workshop - Automotive System Level ESD Protection Design in the Times of Multi-Gigabit Data Rates
Device Testing Workshop - Contact CDM: From Characterization Tool to Qualification Standard
Peter de Jong
Tom Meuse
Tom Meuse is an Applications/Product/Technology Engineer for the Compliance Test Solutions division of Thermo Fisher Scientific, which is in Tewksbury MA, USA. He is responsible for the Thermo Scientific ESD and Latch-up test system operations and future product research. Tom is a member of the ESD Association Device Testing (WG-5.x) committee, chair of the ESDA's WG14 System Level working group and a member of the JEDEC JC-14.1 Committee on Reliability Test Methods. He's also a member of the Joint ESDA/JEDEC Device Testing work group and a contributing member to the Industry Council on ESD Target Levels. In addition, he's also a Board of Directors member on both the National and the Northeast Chapter of the ESD Association. During Tom's 40 plus year career, which began with KeyTek Instruments, he worked on Surge and ESD simulator designs, in both an engineering capacity and as the project manager on both system level and device level testers. He's provided numerous technical seminars focusing on ESD/Latch-up testing and Standards Evolution and has authored and co-authored numerous papers on topics relating to ESD device level testing and ESD system design.
Device Testing Workshop - Contact CDM: From Characterization Tool to Qualification Standard
Semiconductor Fab ESD/Electrostatic Attraction (ESA) Controls Discussion Group
Larry Levit
Dr. Larry Levit provides a variety of ESD consulting services as LBL Scientific. He was Global ESD program Manager for Finisar Corporation and Chief Scientist for MKS, Ion Systems, He has over 20 years of experience in the field of ESD control. He is a NARTE Certified ESD Engineer. Levit has audited cleanrooms on three continents and is recognized as a problem solver. He has successfully devised solutions to manufacturing problems to reduce ESD yield loss, contamination issues and reticle damage. Before joining MKS, Ion Systems, Levit held technical rolls at LeCroy Corporation and Jandel Scientific Software. At LeCroy, he contributed to the instrumentation designs for 6 experiments which produced Nobel prizes in physics. Levit taught physics at CWRU, LSU, and at Napa Valley Community College. He is a senior member of the ESD Association, a senior member of the IEST and chairs the WG CC022 Working Group for IEST. Levit graduated from Case Institute of Technology, Cleveland, Ohio with a BS degree in physics with honors. He then went on to earn a Ph.D. in Experimental High Energy Physics from Case Western Reserve University.
Andrew Nold
Andy Nold is a Quality Engineer and Commodity Engineer at Teradyne near Chicago, IL. He is the Factory ESD subject matter expert and performs the company’s internal ESD audits. He has worked for Teradyne since 2011.
Prior to Teradyne, Andy worked for the FAA, a small aerospace company, and the US Navy. Andy graduated from the University of Wisconsin with a bachelor’s degree in Applied Math, Engineering, and Physics and a master’s degree in Engineering Mechanics.
Outside of work, Andy likes to spend time with his wife and kids.